TOF-SMIS

SurfaceSeer is a compact, affordable, TOF-SIMS designed for ease of use and speed of data acquisition. All the spectrometer tuning has been pre-set in the electronics, so that the surface chemistry of insulating, metals and semiconductor samples can be determined quickly and efficiently.

• Very high surface sensitivity (1x10⁹ atoms/cm² )
• Very simple to use (1/2 day training)
• Conducting and insulating surfaces
• Positive and Negative SIMS
• >2500 M/ΔM using time-of-flight Reflectron mass analyser
• Mass range >1000m/z
• Mass accuracy of ± 5mamu.
• Analysis area ~75um to 500um
• Elemental and molecular information
• Separates common organics from elements
• Isotopic analysis
• Sputter cleaning capability
• 5 minute sample pump down from atmosphere
• 1 minute analysis
• Affordable
• Expandable
• Data libraries available