永久破解千层浪平台盒子

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Semiconductor Measurement systemm

  • Non contact surface curvature and thin film stress
Non contact surface curvature and thin film stress

Non contact surface curvature and thin film stress

  • Product description: Non contact surface curvature and thin film stress
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Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
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